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Probe Card PCB: Enabling High-Pin-Count and High-Speed Wafer-Level Testing
As semiconductor devices continue to scale down while pin counts and test speeds increase, wafer-level testing has become more demanding than ever. At the center of this process is the probe card PCB, a precision-engineered substrate that ensures accurate electrical connection between automated test equipment (ATE) and semiconductor wafers. A well-designed probe card PCB is...
